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97
JEOL atomic force microscopy
(a) Optical <t>microscopy</t> image and (b) SEM image of C 70 /3,5-TPP nanoribbons.
Atomic Force Microscopy, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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NanoLab Inc jspm-5200 scanning probe microscopy
(a) Optical <t>microscopy</t> image and (b) SEM image of C 70 /3,5-TPP nanoribbons.
Jspm 5200 Scanning Probe Microscopy, supplied by NanoLab Inc, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+jeol+jspm-5200/jspm+5200+scanning+probe+microscopy/pm38138321-132-7-16
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97
JEOL atomic force microscope
(a) Optical <t>microscopy</t> image and (b) SEM image of C 70 /3,5-TPP nanoribbons.
Atomic Force Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 97/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+jeol+jspm-5200/JSM-7500F+Scanning+Electron+Microscope/10__1016_slash_j__colsurfa__2016__11__033-47-22-27
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atomic force microscope - by Bioz Stars, 2026-10
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98
JEOL jspm 5200 scanning electron microscope
(a) Optical <t>microscopy</t> image and (b) SEM image of C 70 /3,5-TPP nanoribbons.
Jspm 5200 Scanning Electron Microscope, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscopy+jeol+jspm-5200/JSM-7600F+Scanning+Electron+Microscope/10__1016_slash_j__ecoleng__2016__05__070-75-21-27
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Image Search Results


(a) Optical microscopy image and (b) SEM image of C 70 /3,5-TPP nanoribbons.

Journal: RSC Advances

Article Title: Fullerene C 70 /porphyrin hybrid nanoarchitectures: single-cocrystal nanoribbons with ambipolar charge transport properties †

doi: 10.1039/d2ra02669d

Figure Lengend Snippet: (a) Optical microscopy image and (b) SEM image of C 70 /3,5-TPP nanoribbons.

Article Snippet: The structure and morphology of the obtained nanoribbons were analyzed by scanning electron microscopy (SEM; JEOL JSM-6700F, 5 kV), atomic force microscopy (AFM, JEOL, JSPM-5200), a micro-Raman system (Photon Design) equipped with a semiconductor laser with a wavelength of 532 nm, and a single crystal diffractometer (Rigaku Saturn CCD) using Mo Kα X-ray radiation at 113 K. The diffuse reflectance spectra of the nanoribbons were recorded using a UV-Vis-NIR spectroscope (JASCO V-570) equipped with an integrating sphere.

Techniques: Microscopy